NanoWorld today officially introduced its new Hybrid-Nitride AFM probe for contact-mode. The Hybrid-Nitride™ probe combines silicon nitride cantilevers and tips with unique features like single holder ...

Infrared (IR) spectroscopy is one of the most accepted analytical measurement methods for the characterization of materials in government, academic, and industrial R&D laboratories. The spatial ...

From materials science to biotechnology, the field of nanotechnology has branched out into various areas of research. Several of these applications are predicated on the capacity to fabricate or ...

May 16, 2014. Agilent Technologies Inc. has introduced its AFM-enabled scanning electrochemical microscopy (SECM) mode, a seamlessly integrated technology package that enables scientists to perform ...

Atomic force microscopy (AFM) is a popular imaging and characterization technique. AFM uses a probe to scan the surface of a material—sometimes tapping it, sometimes scanning above it—and it is a ...

What Is Atomic Force Microscopy? Atomic force microscopy (AFM) is a powerful technique that enables surface ultrastructure visualization at molecular resolution. 1 Besides three-dimensional (3D) ...

Park Systems – Enabling Nanoscale Advances Park Systems serves its customers with a complete range of AFM solutions including AFM systems, options, and software, along with global service and support.